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Instrument: XRF : X-Ray Fluorescence Spectrometer
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Description
X-Ray Fluorescence spectrometer (XRF:

Primary X-Rays are used to excite (fluoresce) X-rays in the
specimen. A fused disc or pressed pellet is used for the
determination of major element concentrations or trace element
abundances in a bulk specimen. The X-ray detector utilizes a set
of diffracting crystals specially positioned to detect one
characteristic X-ray at-a-time. This sequential measurement of
X-rays is termed Wavelength Dispersive Spectroscopy (WDS).

Additional information available at
http://www.nmnh.si.edu/minsci/labs/xrf.htm